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Rapid, General-Purpose Patterning of Silicon Nitride Thin Films Under Ambient Conditions for Applications Including Fluid Channel and SERS Substrate Formation.
- Source :
- ACS Applied Nano Materials; 3/27/2020, Vol. 3 Issue 3, p2969-2977, 9p
- Publication Year :
- 2020
-
Abstract
- Silicon nitride thin films are useful as etch-stop masks in micro- and nanofabrication. As structural elements, they are prevalent in applications as diverse as single-molecule sensing, transmission electron microscopy, ultrafast spectroscopy, superfluidity studies, and high flux liquid filtering. A hand-held "flameless" Tesla-coil lighter was used to create vias through 200 nm silicon nitride (SiN<subscript>x</subscript>) films coating silicon wafers. The processing allowed spatially directed KOH etching of the underlying Si. Patterning could be achieved with a hard mask or rastering of the spatially confined discharge, offeringî—¸with low barriers to rapid useî—¸particular capabilities that might otherwise be out of reach to researchers without access to conventional, instrumentation-intensive micro- and nanofabrication workflows. General patterning capabilities were demonstrated, followed by the formation of a trench suitable for microfluidic applications. Finally, a discharge-treated thin film surface was sputter coated with gold to create a surface enhanced Raman spectroscopy (SERS) substrate that was then used to detect a test analyte at ppm concentration. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 25740970
- Volume :
- 3
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- ACS Applied Nano Materials
- Publication Type :
- Academic Journal
- Accession number :
- 148400574
- Full Text :
- https://doi.org/10.1021/acsanm.0c00248