Back to Search Start Over

Rapid, General-Purpose Patterning of Silicon Nitride Thin Films Under Ambient Conditions for Applications Including Fluid Channel and SERS Substrate Formation.

Authors :
Sheetz, Brian S.
Bandara, Y.M. Nuwan D.Y.
Rickson, Benjamin
Auten, Michael
Dwyer, Jason R.
Source :
ACS Applied Nano Materials; 3/27/2020, Vol. 3 Issue 3, p2969-2977, 9p
Publication Year :
2020

Abstract

Silicon nitride thin films are useful as etch-stop masks in micro- and nanofabrication. As structural elements, they are prevalent in applications as diverse as single-molecule sensing, transmission electron microscopy, ultrafast spectroscopy, superfluidity studies, and high flux liquid filtering. A hand-held "flameless" Tesla-coil lighter was used to create vias through 200 nm silicon nitride (SiN<subscript>x</subscript>) films coating silicon wafers. The processing allowed spatially directed KOH etching of the underlying Si. Patterning could be achieved with a hard mask or rastering of the spatially confined discharge, offeringî—¸with low barriers to rapid useî—¸particular capabilities that might otherwise be out of reach to researchers without access to conventional, instrumentation-intensive micro- and nanofabrication workflows. General patterning capabilities were demonstrated, followed by the formation of a trench suitable for microfluidic applications. Finally, a discharge-treated thin film surface was sputter coated with gold to create a surface enhanced Raman spectroscopy (SERS) substrate that was then used to detect a test analyte at ppm concentration. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
25740970
Volume :
3
Issue :
3
Database :
Complementary Index
Journal :
ACS Applied Nano Materials
Publication Type :
Academic Journal
Accession number :
148400574
Full Text :
https://doi.org/10.1021/acsanm.0c00248