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Characterization of the reflectivity of various black and white materials.

Authors :
Navarro, Ramón
Geyl, Roland
Schmidt, Luke M.
Aldoroty, Lauren N.
Alam, Yasin
Bush, Leonardo
DePoy, D. L.
Holden, Matthew
Kim, Doyeon
Marshall, J. L.
Perkey, Mason
Source :
Proceedings of SPIE; 5/28/2020, Vol. 11451, p114512S-114512S-7, 1p
Publication Year :
2020

Details

Language :
English
ISSN :
0277786X
Volume :
11451
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
148249625
Full Text :
https://doi.org/10.1117/12.2562759