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Digital calibration technique using a signed counter for charge pump mismatch in phase‐locked loops.

Authors :
Jeong, Chan‐Hui
Kim, Kyu‐Young
Kwon, Chan‐Keun
Kim, Hoonki
Kim, Soo‐Won
Source :
IET Circuits, Devices & Systems (Wiley-Blackwell); Nov2013, Vol. 7 Issue 6, p313-318, 6p
Publication Year :
2013

Abstract

The authors adopt a digital technique to calibrate the current mismatch of the charge pump in phase‐locked loops. The proposed digital calibration technique using a signed counter reduces the calibration time up to a minimum of 64% as compared with the other techniques. This technique is designed by a standard 0.18 μm CMOS technology. The calibration time is 32.8 μs, the average power is 6.2 mW at a 1.8 V power supply and the effective area is 0.263 mm2. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
1751858X
Volume :
7
Issue :
6
Database :
Complementary Index
Journal :
IET Circuits, Devices & Systems (Wiley-Blackwell)
Publication Type :
Academic Journal
Accession number :
148145182
Full Text :
https://doi.org/10.1049/iet-cds.2013.0011