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The Oxide/Nitride Interface: a study for gate dielectrics and field passivation.
- Source :
- MRS Online Proceedings Library; 2003, Vol. 786 Issue 1, p1-12, 12p
- Publication Year :
- 2003
Details
- Language :
- English
- ISSN :
- 19464274
- Volume :
- 786
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- MRS Online Proceedings Library
- Publication Type :
- Conference
- Accession number :
- 147646310
- Full Text :
- https://doi.org/10.1557/PROC-786-E8.5