X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1− x In x As thin films.

Details

Language :

English

ISSN :

08842914

Volume :

15

Issue :

1

Database :

Complementary Index

Journal :

Journal of Materials Research

Publication Type :

Academic Journal

Accession number :

147315720

Full Text :

https://doi.org/10.1557/JMR.2000.0012