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Extraction and Modeling of Self-Heating and Mutual Thermal Coupling Impedance of Bipolar Transistors.
- Source :
- IEEE Journal of Solid-State Circuits; Oct2004, Vol. 39 Issue 10, p1764-1772, 9p, 3 Diagrams, 1 Chart, 9 Graphs
- Publication Year :
- 2004
-
Abstract
- A measurement system comprised of an ultra-low-distortion function generator, lock,in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189200
- Volume :
- 39
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- IEEE Journal of Solid-State Circuits
- Publication Type :
- Academic Journal
- Accession number :
- 14730733
- Full Text :
- https://doi.org/10.1109/JSSC.2004.833766