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The chemistry and energetics of the interface between metal halide perovskite and atomic layer deposited metal oxides.

Authors :
Bracesco, Andrea E. A.
Burgess, Claire H.
Todinova, Anna
Zardetto, Valerio
Koushik, Dibyashree
Kessels, Wilhelmus M. M (Erwin)
Dogan, Ilker
Weijtens, Christ H. L.
Veenstra, Sjoerd
Andriessen, Ronn
Creatore, Mariadriana
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Nov2020, Vol. 38 Issue 6, p1-13, 13p
Publication Year :
2020

Abstract

The chemistry of the interface between the metal halide perovskite absorber and the charge transport layer affects the performance and stability of metal halide perovskite solar cells (PSCs). The literature provides several examples of poor PSC conversion efficiency values, when electron transport layers (ETLs), such as SnO<subscript>2</subscript> and TiO<subscript>2</subscript>, are processed by atomic layer deposition (ALD) directly on the perovskite absorber. In the present work, we shed light on the chemical modifications occurring at the perovskite surface, during ALD processing of SnO<subscript>2</subscript> and TiO<subscript>2</subscript>, in parallel with the evaluation of the PSC cell performance. The ALD processes are carried out on a (Cs,FA)Pb(I,Br)<subscript>3</subscript> perovskite by adopting tetrakis(dimethylamino)tin(IV) and tetrakis(dimethylamino)titanium(IV) as metal precursors and H<subscript>2</subscript>O as the coreactant for SnO<subscript>2</subscript> and TiO<subscript>2</subscript>, respectively. Perovskite surface modification occurs in the form of an ultrathin PbBr<subscript>2</subscript> layer. Furthermore, in the case of SnO<subscript>2</subscript>, halogen molecules are detected at the interface, in parallel with the initial growth of an oxygen-deficient SnO<subscript>2</subscript>. Subgap defect states just above the valence band maximum of SnO<subscript>2</subscript> are also detected. These states act as hole traps at the perovskite/SnO<subscript>2</subscript> interface, subsequently promoting charge recombination and deteriorating the performance of the cell. We hypothesize that a redox reaction between the perovskite, or its decomposition products, and the Sn metal center of the ALD precursor takes place: I<superscript>−</superscript> and Br<superscript>−</superscript> are oxidized to I<subscript>2</subscript> and Br<subscript>2</subscript>, respectively, and Sn(IV) is reduced to Sn(II). In contrast, the Ti(IV) metal center does not undergo any redox process, and, as a result, a promising 11% power conversion efficiency is measured with TiO<subscript>2</subscript> as the ETL. This result strongly suggests that TiO<subscript>2</subscript> may be a more suitable ETL, when processed directly on the perovskite absorber. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07342101
Volume :
38
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
147242961
Full Text :
https://doi.org/10.1116/6.0000447