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Adversarial Multiple-Target Domain Adaptation for Fault Classification.

Authors :
Ragab, Mohamed
Chen, Zhenghua
Wu, Min
Li, Haoliang
Kwoh, Chee-Keong
Yan, Ruqiang
Li, Xiaoli
Source :
IEEE Transactions on Instrumentation & Measurement; 2021, Vol. 70, p1-11, 11p
Publication Year :
2021

Abstract

Data-driven fault classification methods are receiving great attention as they can be applied to many real-world applications. However, they work under the assumption that training data and testing data are drawn from the same distribution. Practical scenarios have varying operating conditions, which results in a domain-shift problem that significantly deteriorates the diagnosis performance. Recently, domain adaptation (DA) has been explored to address the domain-shift problem by transferring the knowledge from labeled source domain (e.g., source working condition) to unlabeled target domain (e.g., target working condition). Yet, all the existing methods are working under single-source single-target (1S1T) settings. Hence, a new model needs to be trained for each new target domain. This shows limited scalability in handling multiple working conditions since different models should be trained for different target working conditions, which is clearly not a viable solution in practice. To address this problem, we propose a novel adversarial multiple-target DA (AMDA) method for single-source multiple-target (1SmT) scenario, where the model can generalize to multiple-target domains concurrently. Adversarial adaptation is applied to transform the multiple-target domain features to be invariant from the single-source-domain features. This leads to a scalable model with a novel capability of generalizing to multiple-target domains. Extensive experiments on two public datasets and one self-collected dataset have demonstrated that the proposed method outperforms state-of-the-art methods consistently. Our source codes and data are available at https://github.com/mohamedr002/AMDA. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
70
Database :
Complementary Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
147133786
Full Text :
https://doi.org/10.1109/TIM.2020.3009341