Development of x-ray beam profile monitor based on in-house grown crystal and application in electron beam imaging.

Single crystals of Gd₃Ga₃Al₂O₁₂ doped with Ce were grown by the Czchrolaskitechnique. The grown crystals were also co-doped with boron or calcium based on the requirement of the application. A thin disk was cut and optically polished to develop a portable camera to position the X-ray beams and measure the profile at experimental stations of Indus-2 synchrotron beam lines. The problem of saturation in using phosphor screen based cameras could be adequately resolved using these single crystals that have a faster decay component and in-house developed software as per the user requirements. A complete beam profile monitor setup has also been developed indigenously by employing these crystals. Similar crystal in a combination with a charge coupled device camera was also used for the successful imaging of electron beam profiles with electron energy up to 48 kV and beams current of 650 mA without facing the problem of saturation. [ABSTRACT FROM AUTHOR]