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Development of soft X-ray excited optical luminescence (XEOL) measurement setup at beamline 4 in INDUS-1 synchrotron radiation source.

Authors :
Verma, Ravi S.
Yadav, Praveen K.
Joshi, Mukesh P.
Sharma, Veerendra K.
Prajapat, C. L.
Yusuf, S. M.
Source :
AIP Conference Proceedings; 2020, Vol. 2265 Issue 1, p1-4, 4p
Publication Year :
2020

Abstract

We developed an experimental setup for the measurement of soft X-ray excited optical luminescence at the reflectivity beamline (BL-4), Indus-1 synchrotron radiation source. The soft X-ray excited visible luminescence signal from sample was collected using a lens assembly and focused on to a ∼200 µm optical fiber coupled to thermoelectric (TE) cooled spectrometer. The photo luminescence signal from the samples mounted inside a vacuum chamber was brought to the luminescence collection unit mounted in the air through a glass view port. The toroidal grating monochromator of the beamline provided the soft x-rays for excitations in the range of ∼10 eV to 300 eV (100 nm – 4 nm) and the resultant optical luminescence was recorded in the range of ∼350 nm to 900 nm. The developed setup was demonstrated by the recording the visible emission from standard scintillator materials (Cr:Al<subscript>2</subscript>O<subscript>3</subscript>, Ce:YAG, etc.) and β-Ga<subscript>2</subscript>O<subscript>3</subscript> nanostructure. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
2265
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
146875107
Full Text :
https://doi.org/10.1063/5.0017420