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Development of soft X-ray excited optical luminescence (XEOL) measurement setup at beamline 4 in INDUS-1 synchrotron radiation source.
- Source :
- AIP Conference Proceedings; 2020, Vol. 2265 Issue 1, p1-4, 4p
- Publication Year :
- 2020
-
Abstract
- We developed an experimental setup for the measurement of soft X-ray excited optical luminescence at the reflectivity beamline (BL-4), Indus-1 synchrotron radiation source. The soft X-ray excited visible luminescence signal from sample was collected using a lens assembly and focused on to a ∼200 µm optical fiber coupled to thermoelectric (TE) cooled spectrometer. The photo luminescence signal from the samples mounted inside a vacuum chamber was brought to the luminescence collection unit mounted in the air through a glass view port. The toroidal grating monochromator of the beamline provided the soft x-rays for excitations in the range of ∼10 eV to 300 eV (100 nm – 4 nm) and the resultant optical luminescence was recorded in the range of ∼350 nm to 900 nm. The developed setup was demonstrated by the recording the visible emission from standard scintillator materials (Cr:Al<subscript>2</subscript>O<subscript>3</subscript>, Ce:YAG, etc.) and β-Ga<subscript>2</subscript>O<subscript>3</subscript> nanostructure. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 2265
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 146875107
- Full Text :
- https://doi.org/10.1063/5.0017420