Structural characterization of layered tin mono-selenide crystals doped with copper grown by DVT technique.

Crystals of SnSe and SnSe doped with Cu have been synthesized by a direct vapour transport technique. The grown crystals have shiny faces and they do not suffer from the contamination of the transporting agent. The characterization of the crystals has been done by using the techniques of X-ray diffraction, Energy dispersive analysis of X-rays (EDAX), Scanning electron microscope (SEM), Transmission electron microscope (TEM) and electron diffraction. An estimation of crystallite size, dislocation density and lattice strain has been made. In order to understand the mechanism of growth of the crystals, scanning electron microscope and transmission electron microscope have been employed. The crystallinity of the grown crystals has been confirmed by electron diffraction pattern. The implications of the results have been discussed. [ABSTRACT FROM AUTHOR]