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New Targets for Diagnostic Test Generation.
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Sep2020, Vol. 39 Issue 10, p3035-3043, 9p
- Publication Year :
- 2020
-
Abstract
- A logic diagnosis procedure provides information about the defects that are present in a faulty unit as a set of candidate faults. To obtain smaller, and more accurate, sets of candidate faults, a diagnostic test generation procedure produces a test set that distinguishes fault pairs. This paper observes that large sets of candidate faults are obtained when multiple defects are present in a faulty unit, even if a diagnostic test set is used for logic diagnosis. This points to the possibility that fault pairs do not provide a complete set of targets for diagnostic test generation. This paper analyzes the conditions that cause a large set of candidate faults to be formed under a particular logic diagnosis procedure and suggests new targets for diagnostic test generation. The experimental results for benchmark circuits demonstrate that a diagnostic test set can be improved by adding diagnostic tests for the new targets. [ABSTRACT FROM AUTHOR]
- Subjects :
- DIAGNOSIS methods
FAILURE analysis
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 39
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 146079951
- Full Text :
- https://doi.org/10.1109/TCAD.2019.2928971