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Neutron radiation effects on an electronic system on module.

Authors :
Lo Presti, Domenico
Medina, Nilberto H.
Guazzelli, Marcilei A.
Moralles, Mauricio
Aguiar, Vitor A. P.
Oliveira, José R. B.
Added, Nemitala
Macchione, Eduardo L. A.
Siqueira, Paulo de Tarso D.
Zahn, Guilherme
Genezini, Frederico
Bonanno, Danilo
Gallo, Giuseppe
Russo, Salvatore
Sgouros, Onoufrios
Muoio, Annamaria
Pandola, Luciano
Cappuzzello, Francesco
Source :
Review of Scientific Instruments; Aug2020, Vol. 91 Issue 8, p1-5, 5p
Publication Year :
2020

Abstract

The NUMEN (NUclear Matrix Elements for Neutrinoless double beta decay) project was recently proposed with the aim to investigate the nuclear response to Double Charge Exchange reactions for all the isotopes explored by present and future studies of 0νββ decay. The expected level of radiation in the NUMEN experiment imposes severe limitations on the average lifetime of the electronic devices. During the experiments, it is expected that the electronic devices will be exposed to about 10<superscript>5</superscript> neutrons/cm<superscript>2</superscript>/s according to FLUKA simulations. This paper investigates the reliability of a System On Module (SOM) under neutron radiation. The tests were performed using thermal, epithermal, and fast neutrons produced by the Instituto de Pesquisas Energéticas e Nucleares 4.5 MW Nuclear Research Reactor. The results show that the National Instruments SOM is robust to neutron radiation for the proposed applications in the NUMEN project. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
91
Issue :
8
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
145434294
Full Text :
https://doi.org/10.1063/5.0010968