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Effect of Interface Traps on the RTS Noise Behavior of Junctionless Nanowires.

Authors :
Picoli Junior, Marcos P.
Trevisoli, Renan
Doria, Rodrigo T.
Source :
Journal of Integrated Circuits & Systems; 2020, Vol. 15 Issue 2, p1-5, 5p
Publication Year :
2020

Details

Language :
English
ISSN :
18071953
Volume :
15
Issue :
2
Database :
Complementary Index
Journal :
Journal of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
145396991
Full Text :
https://doi.org/10.29292/jics.v15i2.200