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α-FeSi2 as a Buffer Layer for β-FeSi2 Growth: Analysis of Orientation Relationships in Silicide/Silicon, Silicide/Silicide Heterointerfaces.

Authors :
Tarasov, I. A.
Bondarev, I. A.
Romanenko, A. I.
Source :
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Jul2020, Vol. 14 Issue 4, p851-861, 11p
Publication Year :
2020

Abstract

In this manuscript, we attempt to clarify the capability of utilisation of α-FeSi<subscript>2</subscript> nanocrystals as a buffer layer for growth of monocrystalline/high-quality β-FeSi<subscript>2</subscript> direct-gap semiconductor from the point of view of the crystal lattice misfits and near coincidence site (NCS) lattices. Iron silicides-based nanostructures have a wide spectrum of possible industrial applications in different fields. Mainly, interest in these functional materials is caused by their ecological safety and Earth's core abundance that give us the opportunity for greener future with highly effective electronic devices. β-FeSi<subscript>2</subscript> phase due to its allowed direct transition with energy close to 0.87 eV can be used as active material in light emission diodes (LED). Utilisation of buffer layers between silicon substrate and give one more tool to engineer the band structure of semiconducting β‑FeSi<subscript>2</subscript> phase. We attempt to clarify the capability of the utilisation of the α-FeSi<subscript>2</subscript> phase as a buffer layer for the growth of β-FeSi<subscript>2</subscript> direct-gap semiconductor from the point of view of the crystal lattice misfits and near coincidence site (NCS) lattices. Possible β-FeSi<subscript>2</subscript>/α-,γ-,s-FeSi<subscript>2</subscript>/Si orientation relationships (ORs) and habit planes were examined with crystallogeometrical approaches and compared with β-FeSi<subscript>2</subscript>/Si ones. The lowest interplanar and interatomic spacing misfits between silicon lattice and a silicide one are observed for the pair of s-FeSi<subscript>2</subscript>{011}[200]/Si{022}[100] at room temperature and equal to –0.57%. The least interplanar and interatomic spacing misfit of 1.7 and 1.88%, respectively, for β-FeSi<subscript>2</subscript>/Si, can be decreased as low as –0.67 (interplanar) and 0.87 (interatomic) % by placing an α-FeSi<subscript>2</subscript> layer between silicon and β-FeSi<subscript>2</subscript> phase. It is stated that the growth of metastable γ-FeSi<subscript>2</subscript> is also favourable on silicon due to low interplanar and interatomic spacing misfit (–0.77%) and a higher density of NCS in comparison with s-FeSi<subscript>2</subscript>. Design and technological procedure for the synthesis of possible β-FeSi<subscript>2</subscript>/α-FeSi<subscript>2</subscript>/Si heterostructure have been proposed based on the results obtained. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10274510
Volume :
14
Issue :
4
Database :
Complementary Index
Journal :
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques
Publication Type :
Academic Journal
Accession number :
145300954
Full Text :
https://doi.org/10.1134/S1027451020040357