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Influence of stacking disorder on cross-plane thermal transport properties in TMPS3 (TM = Mn, Ni, Fe).

Authors :
Ju, Hwiin
Jeong, Do-Gyeom
Choi, Young-Gwan
Son, Suhan
Jung, Wan-Gil
Jung, Myung-Chul
Kang, Soonmin
Han, Myung Joon
Kim, Bong-Joong
Park, Je-Geun
Lee, Jong Seok
Source :
Applied Physics Letters; 8/10/2020, Vol. 117 Issue 6, p1-4, 4p, 1 Color Photograph, 1 Black and White Photograph, 1 Chart, 1 Graph
Publication Year :
2020

Abstract

We investigated the thermal transport properties of magnetic van der Waals materials, TMPS<subscript>3</subscript> (TM = Mn, Ni, and Fe), using the time-domain thermoreflectance technique. We determined the cross-plane thermal conductivity, which turns out to be relatively low, i.e., about 1 W m<superscript>−1</superscript> K<superscript>−1</superscript> for all TMPS<subscript>3</subscript> investigated. When compared with previous results of graphite and transition metal dichalcogenides (TMDs), thermal conductivity becomes smaller as it goes from graphite to TMDs to TMPS<subscript>3</subscript>, and the difference is larger at low temperature, e.g., around 50 K. From the Callaway model analysis, we could attribute the large thermal conductivity reduction for TMPS<subscript>3</subscript>, particularly at low temperature, to the phonon scattering from the boundary. We actually confirmed the existence of the large population of the stacking faults with the cross-sectional transmission electron microscopy image of MnPS<subscript>3</subscript>. This suggests that intrinsic or extrinsic stacking faults formed in van der Waals materials and their heterostructures can play an important role in reducing the cross-plane thermal conductivity as a source of the boundary scattering. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
117
Issue :
6
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
145161848
Full Text :
https://doi.org/10.1063/5.0013107