Cite
Identifying, understanding and controlling defects and traps in halide perovskites for optoelectronic devices: a review.
MLA
Chen, Xiaoxuan, et al. “Identifying, Understanding and Controlling Defects and Traps in Halide Perovskites for Optoelectronic Devices: A Review.” Journal of Physics D: Applied Physics, vol. 53, no. 37, Sept. 2020, pp. 1–25. EBSCOhost, https://doi.org/10.1088/1361-6463/ab9134.
APA
Chen, X., Cheng, S., Xiao, L., & Sun, H. (2020). Identifying, understanding and controlling defects and traps in halide perovskites for optoelectronic devices: a review. Journal of Physics D: Applied Physics, 53(37), 1–25. https://doi.org/10.1088/1361-6463/ab9134
Chicago
Chen, Xiaoxuan, Shijia Cheng, Lian Xiao, and Handong Sun. 2020. “Identifying, Understanding and Controlling Defects and Traps in Halide Perovskites for Optoelectronic Devices: A Review.” Journal of Physics D: Applied Physics 53 (37): 1–25. doi:10.1088/1361-6463/ab9134.