Scanning Tunneling Measurements in Membrane-Based Nanostructures: Spatially-Resolved Quantum State Analysis in Postprocessed Epitaxial Systems for Optoelectronic Applications.

Details

Language :

English

ISSN :

25740970

Volume :

2

Issue :

7

Database :

Complementary Index

Journal :

ACS Applied Nano Materials

Publication Type :

Academic Journal

Accession number :

145013616

Full Text :

https://doi.org/10.1021/acsanm.9b01124