Magnetic and Transport properties of Co-Cu Microwires.

Authors :: Zhukova, V.
del Val, J. J.
Ipatov, M.
Ilyn, M.
Granovsky, A.
Zhukov, A.
Source :: International Journal on Smart Sensing & Intelligent Systems; 2014, Vol. 7 Issue 5, p1-6, 6p
Publication Year :: 2014
Abstract: We report on the magnetic, transport and structural properties of Co<subscript>x</subscript>-Cu<subscript>100-x</subscript> (5=x=40) glass-coated microwires. For x=5 we observed the resistivity minimum at 40 K associated with the Kondo effect. For x = 10 we observed considerable magnetoresistance effect. Temperature dependence of susceptibility show considerable difference for x>10 and x= 10 attributed to the presence of small Co grains embedded in the Cu matrix f or x = 1 0. U sing X -ray diffraction we found, that the structure of Co<subscript>x</subscript>-Cu<subscript>100-x</subscript> microwires x = 10 is granular consisting of two phases: fcc Cu appearing in all the samples and fcc a-Co presented only in microwires with higher Co content. [ABSTRACT FROM AUTHOR]