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Effects of thickness on thermoelectric properties of Bi0.5Sb1.5Te3 thin films.

Authors :
Han, Xiaobin
Zhang, Zhenyu
Liu, Zhengmao
Xu, Chao
Lu, Xiaowei
Sun, Lin
Jiang, Peng
Source :
Applied Nanoscience; Jul2020, Vol. 10 Issue 7, p2375-2381, 7p
Publication Year :
2020

Abstract

Bi<subscript>2</subscript>Te<subscript>3</subscript>-based materials have been widely utilized for commercial bulk thermoelectric (TE) devices. For the manufacture of miniaturized TE devices, the large-scale deposition of high-performance Bi<subscript>2</subscript>Te<subscript>3</subscript>-based thin films is crucial. However, it has not yet been effectively resolved. Herein, the Bi<subscript>0.5</subscript>Sb<subscript>1.5</subscript>Te<subscript>3</subscript> films with different thicknesses were grown on sapphire substrates by controlling the co-sputtering time. We reveal that the film thickness has a significant impact on the electrical transport properties. Due to the mutual influence of electrical conductivity and Seebeck coefficient, there exists an optimal thickness with the maximum power factor is as high as 2900 μW m<superscript>−1</superscript> K<superscript>−2</superscript>. Therefore, systematic research on the thickness-dependent TE characteristics of Bi<subscript>2</subscript>Te<subscript>3</subscript>-based films and the deposition of high-performance films will provide important information for the large-scale development of high-performance micro-TE devices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21905509
Volume :
10
Issue :
7
Database :
Complementary Index
Journal :
Applied Nanoscience
Publication Type :
Academic Journal
Accession number :
144296533
Full Text :
https://doi.org/10.1007/s13204-020-01441-8