Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-resolved Neutron Imaging.

MLA

Kenichi Watanabe, et al. “Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging.” Sensors & Materials, vol. 32, no. 4, Part 2, Apr. 2020, pp. 1435–43. EBSCOhost, https://doi.org/10.18494/SAM.2020.2744.

APA

Kenichi Watanabe, Kio Matsumoto, Akira Unitani, Keitaro Hitomi, Mitsuhiro Nogami, & Kockelmann, W. (2020). Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-resolved Neutron Imaging. Sensors & Materials, 32(4, Part 2), 1435–1443. https://doi.org/10.18494/SAM.2020.2744

Chicago

Kenichi Watanabe, Kio Matsumoto, Akira Unitani, Keitaro Hitomi, Mitsuhiro Nogami, and Winfried Kockelmann. 2020. “Crystalline Characterization of TlBr Semiconductor Detectors Using Wavelength-Resolved Neutron Imaging.” Sensors & Materials 32 (4, Part 2): 1435–43. doi:10.18494/SAM.2020.2744.