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High performance negative capacitance field-effect transistor featuring low off-state current, high on/off current ratio, and steep sub-60 mV dec−1 swing.

Authors :
Chien Liu
Hsuan-Han Chen
Yi-Chun Tung
Wei-Chun Wang
Zhong-Ying Huang
Bing-Yang Shih
Szu-Yen Hsiung
Shih-An Wang
Yu-Chi Fan
Tsung-Ming Lee
Chien-Liang Lin
Zi-You Huang
Hsiu-Ming Liu
Sheng Lee
Wu-Ching Chou
Chun-Hu Cheng
Hsiao-Hsuan Hsu
Source :
Japanese Journal of Applied Physics; Apr2020, Vol. 59 Issue SG, p1-1, 1p
Publication Year :
2020

Abstract

In this work, we demonstrated that the 5-nm-thick HfAlO<subscript>x</subscript> negative capacitance transistor (NCFET) with optimized Al doping can achieve a minimum 33 mV dec<superscript>−1</superscript> subthreshold swing (SS), an ultralow I<subscript>off</subscript> of 7.44 fA μm<superscript>−1</superscript>, and a high I<subscript>on</subscript>/I<subscript>off</subscript> ratio of 1.9 × 10<superscript>8</superscript>. The NC switching with sub-60 mV dec<superscript>−1</superscript>SS can be implemented from V<subscript>DS</subscript> = 0.2 V to 0.8 V due to an ultralow off-state leakage current. The experimental results reveal that well-controlled Al doping in HfAlO<subscript>x</subscript> not only reduces off-state leakage of the transistor, but also improves the ferroelectric NC effect to achieve a sub-60 mV dec<superscript>−1</superscript> switching under a favorably low sub-1 voltage. This scaled HfAlO<subscript>x</subscript> NCFET with optimized Al doping and fluorine defect passivation shows the great potential for the application of low power logic devices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00214922
Volume :
59
Issue :
SG
Database :
Complementary Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
142802815
Full Text :
https://doi.org/10.7567/1347-4065/ab6420