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Optical thickness of a plant leaf measured with THz pulse echoes.
- Source :
- Proceedings of SPIE; 12/8/2019, Vol. 11279, p112790L-112790L-7, 1p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 11279
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 142772117
- Full Text :
- https://doi.org/10.1117/12.2543710