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Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines.
- Source :
- Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Mar2020, Vol. 38 Issue 2, p1-5, 5p
- Publication Year :
- 2020
-
Abstract
- In this paper, the authors present the characterization experiments of a 20 fs vacuum ultraviolet beam from a high harmonic generation source. The beam hits a silicon sample and passes a triple reflection gold polarizer located inside an ultrahigh vacuum chamber. The polarizer's Malus curve was obtained; the total acquisition time for each point of the curve was 30 s. This aims to be the first vacuum ultraviolet time-resolved user station dedicated to ellipsometry. The high harmonic beam is generated by a 12 mJ, 1 kHz, 20 fs, in-house-developed laser and detected by a back-illuminated charge-coupled device. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 21662746
- Volume :
- 38
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
- Publication Type :
- Academic Journal
- Accession number :
- 142452754
- Full Text :
- https://doi.org/10.1116/1.5129674