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Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines.

Authors :
Espinoza, Shirly
Samparisi, Fabio
Frassetto, Fabio
Richter, Steffen
Rebarz, Mateusz
Finke, Ondrej
Albrecht, Martin
Jurkovic, Matej
Hort, Ondrej
Fabris, Nicola
Zymaková, Anna
Mai, Dong Du
Antipenkov, Roman
Nejdl, Jaroslav
Poletto, Luca
Andreasson, Jakob
Source :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Mar2020, Vol. 38 Issue 2, p1-5, 5p
Publication Year :
2020

Abstract

In this paper, the authors present the characterization experiments of a 20 fs vacuum ultraviolet beam from a high harmonic generation source. The beam hits a silicon sample and passes a triple reflection gold polarizer located inside an ultrahigh vacuum chamber. The polarizer's Malus curve was obtained; the total acquisition time for each point of the curve was 30 s. This aims to be the first vacuum ultraviolet time-resolved user station dedicated to ellipsometry. The high harmonic beam is generated by a 12 mJ, 1 kHz, 20 fs, in-house-developed laser and detected by a back-illuminated charge-coupled device. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21662746
Volume :
38
Issue :
2
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
Publication Type :
Academic Journal
Accession number :
142452754
Full Text :
https://doi.org/10.1116/1.5129674