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Electromagnetic Induction Heating and Image Fusion of Silicon Photovoltaic Cell Electrothermography and Electroluminescence.
- Source :
- IEEE Transactions on Industrial Informatics; Jul2020, Vol. 16 Issue 7, p4413-4422, 10p
- Publication Year :
- 2020
-
Abstract
- In the process of research, development, production, service, and maintenance of silicon photovoltaic (Si-PV) cells and the requirements for detection technology are becoming more and more important. This paper aims to investigate electromagnetic induction (EMI) and image fusion to improve the detection effect of electrothermography (ET) and electroluminescence (EL) of multidefects in Si-PV cells. First, the principles of ET, EL, and other physical processes including EMI, thermal radiation, and luminescence radiation are analyzed in this paper. ET and EL techniques after EMI improvement are used to detect different defects including scratch, broken gridline, surface impurity, hidden crack, and so on. The qualitative results show that EMI can greatly improve the defect detection ability of ET and EL. Then, an image-fusion rule based on L1 norm is proposed to fuse the sparse vector of the ET and EL images. The integration and complementarity of the two wavelength detection data are achieved. Finally, the image-fusion results of sparse representation (SR) algorithm is compared with discrete wavelet transform, curvelet transform, dual-tree complex wavelet transforms, and nonsubsampled contourlet transform. Five objective evaluation indexes including root mean square error, peak signal-to-noise ratio, correlation coefficient, mutual information, and structural similarity index are used to evaluate the fusion results. Overall evaluation results show that the SR algorithm is superior to the other algorithms. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15513203
- Volume :
- 16
- Issue :
- 7
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Industrial Informatics
- Publication Type :
- Academic Journal
- Accession number :
- 142452400
- Full Text :
- https://doi.org/10.1109/TII.2019.2922680