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Book reviews.

Authors :
Simon, Denils Fred
Xie, Wei
Ren, Liqin
Brouwers, H. J. H.
Source :
R&D Management; Sep2004, Vol. 34 Issue 4, p467-473, 7p
Publication Year :
2004

Abstract

Books reviewed: Kathleen Walsh, Foreign High-Tech R&D in China: Risks, Rewards and Implications for US-China Relations Review of leading Chinese journals reporting on R&D management and innovation G. C. Chow, Knowing China [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
RESEARCH
NONFICTION

Details

Language :
English
ISSN :
00336807
Volume :
34
Issue :
4
Database :
Complementary Index
Journal :
R&D Management
Publication Type :
Review
Accession number :
14228648
Full Text :
https://doi.org/10.1111/j.1467-9310.2004.00353.x