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An mm-Wave Synthesizer With Robust Locking Reference-Sampling PLL and Wide-Range Injection-Locked VCO.

Authors :
Liao, Dongyi
Zhang, Yucai
Dai, Fa Foster
Chen, Zhenqi
Wang, Yanjie
Source :
IEEE Journal of Solid-State Circuits; Mar2020, Vol. 55 Issue 3, p536-546, 11p
Publication Year :
2020

Abstract

In this article, a two-stage millimeter (mm)-wave frequency synthesizer with low in-band noise and robust locking reference-sampling techniques is presented. Using a two-stage scheme allows separately dealing with the low phase noise (PN) frequency synthesis in the first stage and the mm-wave frequency multiplication in the second stage, achieving the best overall power efficiency. In the first stage, a voltage domain reference-sampling phase detector (RSPD)-locked loop (RSPLL) is adopted to achieve both low PN and robust locking without additional frequency locking loop. A reference reshaping buffer is implemented to improve the phase detector gain and in-band PN. The reference rising/falling time is programmable to achieve optimal RSPLL performance even under external disturbances. The second stage employs an injection-locked voltage-controlled oscillator (ILVCO) for 4 $\times $ frequency multiplication. A low-power digital frequency tracking loop (FTL) detecting actual frequency errors is implemented in order to achieve wide operation range for the ILVCO while using a high ${Q}$ tank with low power. The prototype synthesizer was fabricated in a 45-nm partially depleted silicon on insulator (PDSOI) CMOS technology. The first stage 9-GHz RSPLL achieves 144-fs integrated jitter with 7.2-mW power consumption, achieving a figure of merit (FoM) of −248 dB and the overall mm-wave synthesizer achieves 251-fs integrated jitter with 20.6-mW power consumption at 35.84 GHz, achieving an FoM of −238.9 dB. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189200
Volume :
55
Issue :
3
Database :
Complementary Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Academic Journal
Accession number :
142008827
Full Text :
https://doi.org/10.1109/JSSC.2019.2959513