Thickness Dependence of Magnetic Properties of Tb–Co/Ti and Tb–Co/Si Multilayers.

Nanoscale [Tb–Co/Ti]_n and [Tb–Co/Si]_n multilayers were designed and prepared by the rf-sputtering technique. Their structure and magnetic properties have been experimentally studied. Low-angle X‑ray diffraction studies confirmed that a well-defined layered structure was formed in all investigated cases. The change in the magnetic properties of multilayers with a decrease in the thickness of the Tb–Co layers was due to both the size effect and the influence of the material of the non-magnetic spacers, namely the reduction of the Co atom moment because of the electron charge transfer from atoms of the Ti or Si spacers to atoms of the cobalt. [ABSTRACT FROM AUTHOR]