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Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode.
- Source :
- IEEE Transactions on Nuclear Science; Feb2020, Vol. 67 Issue 2, p57-62, 6p
- Publication Year :
- 2020
-
Abstract
- A sensitive volume is developed using pulsed laser-induced collected charge for two bias conditions in an epitaxial silicon diode. These sensitive volumes show good agreement with the experimental two-photon absorption laser-induced collected charge at a variety of focal positions and pulse energies. When compared to ion-induced collected charge, the laser-based sensitive volume overpredicts the experimental collected charge at low bias and agrees at high bias. A sensitive volume based on ion-induced collected charge adequately describes the ion experimental results at both biases. Differences in the amount of potential modulation explain the differences between the ion- and laser-based sensitive volumes at the lower bias. Truncation of potential modulation by the highly doped substrate, at the higher bias, results in similar sensitive volumes. [ABSTRACT FROM AUTHOR]
- Subjects :
- SILICON diodes
PULSED lasers
LASER beam measurement
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 67
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 141516458
- Full Text :
- https://doi.org/10.1109/TNS.2019.2943472