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Disorder and critical current variability in Josephson junctions.
- Source :
- Journal of Applied Physics; 1/21/2020, Vol. 127 Issue 3, p1-9, 9p, 3 Diagrams, 9 Graphs
- Publication Year :
- 2020
-
Abstract
- We investigate theoretically the origins of observed variations in the critical currents of Nb/Al-AlO x /Nb Josephson junctions in terms of various types of disorder. We consider the following disorder sources: vacancies within the Al layer, thickness variations in the AlO x layer, and "pinholes" (i.e., point contacts) within the AlO x layer. The calculations are all performed by solving the microscopic Bogoliubov–de Gennes Hamiltonian self-consistently. It is found that a small concentration of vacancies within the Al layer is sufficient to suppress the critical current, while the presence of a small number of thick regions of the oxide layer induces a similar effect as well. The pinhole scenario is found to result in anomalous behavior that resembles neither that of a pure tunnel junction nor that of a superconductor–normal–superconductor junction but a regime that interpolates between these two limits. We comment on the degree to which each of the three scenarios describes the actual situation present in these junctions. [ABSTRACT FROM AUTHOR]
- Subjects :
- JOSEPHSON junctions
ELECTRIC conduits
DISEASES
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 127
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 141347533
- Full Text :
- https://doi.org/10.1063/1.5125765