Back to Search
Start Over
Development of CMOS sensors for electron microscopy.
- Source :
- Journal of Instrumentation; Dec2019, Vol. 14 Issue 12, p1-1, 1p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 17480221
- Volume :
- 14
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Journal of Instrumentation
- Publication Type :
- Academic Journal
- Accession number :
- 141287159
- Full Text :
- https://doi.org/10.1088/1748-0221/14/12/C12002