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Mechanism of Improved Luminescence Intensity of Ultraviolet Light Emitting Diodes (UV-LEDs) Under Thermal and Chemical Treatments.

Authors :
Sheikhi, Moheb
Guo, Wei
Dai, Yijun
Cui, Mei
Hoo, Jason
Guo, Shiping
Xu, Liang
Liu, Jianzhe
Ye, Jichun
Source :
IEEE Photonics Journal; Dec2019, Vol. 11 Issue 6, p1-8, 8p
Publication Year :
2019

Abstract

In this work, the influences of thermal annealing and chemical passivation on the optical and electrical properties of ultraviolet light-emitting-diode (UV-LED) were investigated. The electroluminescence (EL) intensities of the LEDs under KOH treatment and thermal annealing increased by 48% and 81%, respectively compared to as-fabricated LED under current level of 10 mA. Cathodoluminescence (CL) mapping of UV-LEDs confirmed no variation of the density of the non-radiative recombination centers after surface treatments, and no obvious change in surface morphology was identified due to lacking of energy for surface atom migration. However, Raman spectroscopy indicates a relaxation of compressive strains inside the thin film after both thermal and chemical treatments, and conductive atomic force microscopy (c-AFM) also illustrated reduced leakage current after KOH passivation, which are responsible for the improved luminescence properties of UV-LEDs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
19430655
Volume :
11
Issue :
6
Database :
Complementary Index
Journal :
IEEE Photonics Journal
Publication Type :
Academic Journal
Accession number :
141051766
Full Text :
https://doi.org/10.1109/JPHOT.2019.2950049