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4H-SiC epitaxial Schottky detectors: deep-level transient spectroscopy (DLTS) and pulse height spectroscopy (PHS) measurements.

Authors :
Mandal, Krishna C.
Kleppinger, Joshua W.
Sajjad, Mohsin
Source :
Proceedings of SPIE; 6/26/2019, Vol. 11114, p1-9, 9p
Publication Year :
2019

Details

Language :
English
ISSN :
0277786X
Volume :
11114
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
140954808
Full Text :
https://doi.org/10.1117/12.2530184