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Background Offset Calibration for Comparator Based on Temperature Drift Profile.
- Source :
- IEEE Transactions on Circuits & Systems. Part II: Express Briefs; Oct2019, Vol. 66 Issue 10, p1648-1652, 5p
- Publication Year :
- 2019
-
Abstract
- This brief presents a background digital calibration for comparator offset against temperature drift, which relies on the linearity characteristic of the offset versus temperature drift profile. While a reference comparator is introduced as the temperature tracking circuit, the calibration can work in the background without interrupting the normal operation. The calibration achieves a measured offset of $< 400~{{\mu }}\text{V}$ over a temperature range of −40 °C to 125 °C. Fabricated in 65-nm CMOS the chip prototype includes the calibration and works under a 1 V power supply. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15497747
- Volume :
- 66
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Circuits & Systems. Part II: Express Briefs
- Publication Type :
- Academic Journal
- Accession number :
- 138898514
- Full Text :
- https://doi.org/10.1109/TCSII.2019.2923885