Back to Search Start Over

Background Offset Calibration for Comparator Based on Temperature Drift Profile.

Authors :
Li, Xiaochao
Chan, Chi-Hang
Zhang, Qi
Zhu, Yan
Martins, R. P.
Source :
IEEE Transactions on Circuits & Systems. Part II: Express Briefs; Oct2019, Vol. 66 Issue 10, p1648-1652, 5p
Publication Year :
2019

Abstract

This brief presents a background digital calibration for comparator offset against temperature drift, which relies on the linearity characteristic of the offset versus temperature drift profile. While a reference comparator is introduced as the temperature tracking circuit, the calibration can work in the background without interrupting the normal operation. The calibration achieves a measured offset of $< 400~{{\mu }}\text{V}$ over a temperature range of −40 °C to 125 °C. Fabricated in 65-nm CMOS the chip prototype includes the calibration and works under a 1 V power supply. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15497747
Volume :
66
Issue :
10
Database :
Complementary Index
Journal :
IEEE Transactions on Circuits & Systems. Part II: Express Briefs
Publication Type :
Academic Journal
Accession number :
138898514
Full Text :
https://doi.org/10.1109/TCSII.2019.2923885