Back to Search Start Over

Insight into Al–Si interface of PERC by Kelvin probe force microscopy.

Authors :
Wang, Xingbo
Qian, Guoyu
Gao, Zhou
Jiang, Xing
Chen, Yongji
Liu, Jian
Lin, Yuan
Pan, Feng
Source :
Functional Materials Letters; Oct2019, Vol. 12 Issue 5, pN.PAG-N.PAG, 5p
Publication Year :
2019

Details

Language :
English
ISSN :
17936047
Volume :
12
Issue :
5
Database :
Complementary Index
Journal :
Functional Materials Letters
Publication Type :
Academic Journal
Accession number :
138674038
Full Text :
https://doi.org/10.1142/S1793604719500784