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Effect of cantilevers' dimensions on phase contrast in multifrequency atomic force microscopy.

Authors :
Ehsanipour, Milad
Damircheli, Mehrnoosh
Eslami, Babak
Source :
Microscopy Research & Technique; Sep2019, Vol. 82 Issue 9, p1438-1447, 10p
Publication Year :
2019

Abstract

During the past years, different theoretical and experimental works are done to enhance the observables (mostly higher eigenmode's phase contrast) in multifrequency atomic force microscopy methods. In this study, the geometry of rectangular cantilevers is studied and an optimum dimension that can provide maximum phase contrast for a given set of samples is found. The analysis is done both numerically and experimentally. A sensitivity analysis is provided to demonstrate which dimension (length, width, thickness, tip‐radius, and cantilever and sample angle) of the cantilever has a higher effect on the results. The effects of geometrical dimensions are categorized into to: (a) effect on dynamics of the cantilever (b) effects on cantilever's specifications (i.e., spring constant and quality factor). Length and width of the cantilever dominates the static behavior of the cantilever. While thickness (for lower values), tip radius, and approach angle mostly affect the dynamic behavior of the cantilever. Theoretically, it is found as the length increases the phase contrast increase. This relationship is opposite for width. It was also observed that the effect of thickness for a specific range on the phase contrast depends on the 1st eigenmode amplitude setpoint. This study shows for having higher contrast, lower tip‐radius is needed. The optimum angle between cantilever and sample to enhance bimodal atomic force microscopy imaging is also found. Based on the commercially available cantilevers, the optimum cantilever dimension is provided. Three different cantilevers with similar dimensions are experimentally tested and theoretical results are verified. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
1059910X
Volume :
82
Issue :
9
Database :
Complementary Index
Journal :
Microscopy Research & Technique
Publication Type :
Academic Journal
Accession number :
138124607
Full Text :
https://doi.org/10.1002/jemt.23297