Real-time Thermographic Methodology with High-accuracy Temperature Monitoring Applied to Stacked Package of High-power Semiconductor Laser Diode.

MLA

Shun-Lung Yen, et al. “Real-Time Thermographic Methodology with High-Accuracy Temperature Monitoring Applied to Stacked Package of High-Power Semiconductor Laser Diode.” Sensors & Materials, vol. 31, no. 7, Part 1, July 2019, pp. 2183–93. EBSCOhost, https://doi.org/10.18494/SAM.2019.2055.

APA

Shun-Lung Yen, Shiang-Feng Tang, Chung-Wei Ou, Chin-Jung Chao, Hsin-Yen Cheng, Ing-Jiunn Su, & Tzu-Chiang Chen. (2019). Real-time Thermographic Methodology with High-accuracy Temperature Monitoring Applied to Stacked Package of High-power Semiconductor Laser Diode. Sensors & Materials, 31(7, Part 1), 2183–2193. https://doi.org/10.18494/SAM.2019.2055

Chicago

Shun-Lung Yen, Shiang-Feng Tang, Chung-Wei Ou, Chin-Jung Chao, Hsin-Yen Cheng, Ing-Jiunn Su, and Tzu-Chiang Chen. 2019. “Real-Time Thermographic Methodology with High-Accuracy Temperature Monitoring Applied to Stacked Package of High-Power Semiconductor Laser Diode.” Sensors & Materials 31 (7, Part 1): 2183–93. doi:10.18494/SAM.2019.2055.