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A High Resolution Vernier Digital-to-Time Converter Implemented with 65 nm FPGA.

Authors :
Yan, Chenggang
Hu, Chen
Wu, Jianhui
Source :
Applied Sciences (2076-3417); Jul2019, Vol. 9 Issue 13, p2705, 12p
Publication Year :
2019

Abstract

Featured Application: Automatic test equipment, Measurement instruments. In this paper, a digital-to-time converter (DTC) based on the three delay lines (3D) Vernier principle is proposed and implemented with field programmable gate arrays (FPGAs). Based on the 3D Vernier principle, the DTC is realized by three period approximate phase locked loops (PLLs). The theoretical fine resolution of the proposed DTC is improved by calculating the period difference two times. The achieved resolution of the proposed DTC is 203 fs realized with an Altera Stratix III FPGA chip, which is about tenfold higher than traditional FPGA-DTC implemented with the same series FPGAs. The worst absolute differential nonlinearity (DNL) and integral nonlinearity (INL) are verified smaller than 0.88 least significant bit (LSB) and 4.4 LSB, respectively. By optimized computation logic, there are only 448 adaptive look-up-tables (ALUTs), 237 registers and three phase locked loops (PLLs) utilized for circuit implementation. Experimental results prove that the proposed DTC features high resolution with low cost. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20763417
Volume :
9
Issue :
13
Database :
Complementary Index
Journal :
Applied Sciences (2076-3417)
Publication Type :
Academic Journal
Accession number :
137457122
Full Text :
https://doi.org/10.3390/app9132705