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Surface energy engineering for LiTaO3 and α-quartz SiO2 for low temperature (<220 °C) wafer bonding.

Authors :
Baker, Brian
Herbots, Nicole
Whaley, Shawn D.
Sahal, Mohammed
Kintz, Jacob
Yano, Aliya
Narayan, Saaketh
Brimhall, Alex L.
Lee, Wey-Lyn
Akabane, Yuko
Culbertson, Robert J.
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2019, Vol. 37 Issue 4, pN.PAG-N.PAG, 17p
Publication Year :
2019

Abstract

Wafer bonding can be substituted for heteroepitaxy when manufacturing specific heterojunction-based devices. Devices manufactured using wafer bonding include multijunction solar cells, integrated sensors, heterogeneously integrated photonic devices on Si (such as high-performance laser diodes), Mach-Zehnder modulators, photodetectors, optical filters, and surface acoustic wave devices. In these devices, creating heterointerfaces between different semiconductors with heavily mismatched lattice constants and/or significant thermal expansion mismatch presents significant challenges for heteroepitaxial growth. High costs and poor yields in heavily mismatched heteroepitaxy can be addressed by wafer bonding in these optoelectronic devices and sensors, including the LiTaO&lt;subscript&gt;3&lt;/subscript&gt;/Si and LiTaO&lt;subscript&gt;3&lt;/subscript&gt;/SiO&lt;subscript&gt;2&lt;/subscript&gt; heterostructures. In the present work, heterostructure formation between piezoelectric LiTaO&lt;subscript&gt;3&lt;/subscript&gt; (100) and Si (100) and α-quartz SiO&lt;subscript&gt;2&lt;/subscript&gt; (100) is investigated via wafer bonding. Direct bonding is selected instead of heteroepitaxy due to a significant thermal expansion mismatch between LiTaO&lt;subscript&gt;3&lt;/subscript&gt; and Si-based materials. The coefficient of thermal expansion (CTE) of LiTaO&lt;subscript&gt;3&lt;/subscript&gt; is 18.3 &#215; 10&lt;superscript&gt;−6&lt;/superscript&gt;/K. This is 1 order of magnitude larger than the CTE for Si, 2.6–2.77 &#215; 10&lt;superscript&gt;−6&lt;/superscript&gt;/K and 25–30 times larger than the CTE for fused SiO&lt;subscript&gt;2&lt;/subscript&gt; and quartz (which ranges 0.54–0.76 &#215; 10&lt;superscript&gt;−6&lt;/superscript&gt;/K). Thus, even at 200 &#176;C, a 4 in. LiTaO&lt;subscript&gt;3&lt;/subscript&gt;/Si bonded pair would delaminate with LiTaO&lt;subscript&gt;3&lt;/subscript&gt; expanding 300 μm in length while Si would expand only by 40 μm. Therefore, direct wafer bonding of LiTaO&lt;subscript&gt;3&lt;/subscript&gt;/Si and LiTaO&lt;subscript&gt;3&lt;/subscript&gt;/SiO&lt;subscript&gt;2&lt;/subscript&gt; is investigated with low temperature (T &lt; 500 K) Nano-Bonding™, which uses surface energy engineering (SEE). SEE is guided by fast, high statistics surface energy measurements using three liquid contact angle analysis, the van Oss/van Oss–Chaudhury–Good theory, and a new, fast Drop Reflection Operative Program analysis algorithm. Bonding hydrophobic LiTaO&lt;subscript&gt;3&lt;/subscript&gt; to hydrophilic Si or SiO&lt;subscript&gt;2&lt;/subscript&gt; is found to be more effective than hydrophilic LiTaO&lt;subscript&gt;3&lt;/subscript&gt; to hydrophobic Si or SiO&lt;subscript&gt;2&lt;/subscript&gt; temperatures for processing LiTaO&lt;subscript&gt;3&lt;/subscript&gt; are limited by thermal decomposition LiTaO&lt;subscript&gt;3&lt;/subscript&gt; into Ta&lt;subscript&gt;2&lt;/subscript&gt;O&lt;subscript&gt;5&lt;/subscript&gt; at T ≥ 180 &#176;C due to Li out-diffusion as much as by LiTaO&lt;subscript&gt;3&lt;/subscript&gt; fractures due to thermal mismatch. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07342101
Volume :
37
Issue :
4
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
137400356
Full Text :
https://doi.org/10.1116/1.5095157