Structural, Surface Topography and Optical Characterization of Nanocrystalline MgxZn1-xO Thin Films Grown by Modified Chemical Bath Deposition (SILAR) Method.

Details

Language :

English

ISSN :

17426588

Volume :

1234

Issue :

1

Database :

Complementary Index

Journal :

Journal of Physics: Conference Series

Publication Type :

Academic Journal

Accession number :

137353373

Full Text :

https://doi.org/10.1088/1742-6596/1234/1/012001