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Elemental Composition of Analogs to Mars Return Samples Studied with X-Ray Fluorescence Imaging at NSLS-II.

Authors :
Thieme, Juergen
Hurowitz, Joel
Schoonen, Martin
Farley, K. A.
Sherman, S.
Hill, John
Source :
Microscopy & Microanalysis; 2018Supplement1, Vol. 24, p498-499, 2p
Publication Year :
2018

Details

Language :
English
ISSN :
14319276
Volume :
24
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
137349648
Full Text :
https://doi.org/10.1017/S1431927618014721