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Experimental and Simulation Methods in Scanning Electron Nanobeam Diffraction.

Authors :
Ophus, Colin
Bustillo, Karen
Pekin, Thomas C
Pryor, AJ
Miao, Jianwei
Shevitski, Brian
Aloni, Shaul
Ercius, Peter
Ciston, Jim
Minor, Andrew M
Source :
Microscopy & Microanalysis; 2018Supplement1, Vol. 24, p2320-2321, 2p
Publication Year :
2018

Details

Language :
English
ISSN :
14319276
Volume :
24
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
137349376
Full Text :
https://doi.org/10.1017/S1431927618012084