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Negative threshold voltage shift in an a-IGZO thin film transistor under X-ray irradiation.
- Source :
- RSC Advances; 2019, Vol. 9 Issue 36, p20865-20870, 6p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 20462069
- Volume :
- 9
- Issue :
- 36
- Database :
- Complementary Index
- Journal :
- RSC Advances
- Publication Type :
- Academic Journal
- Accession number :
- 137320921
- Full Text :
- https://doi.org/10.1039/c9ra03053k