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A Novel 2D Micro-Displacement Measurement Method Based on the Elliptical Paraboloid.

Authors :
Lv, Zekui
Li, Xinghua
Su, Zhikun
Zhang, Dong
Yang, Xiaohuan
Li, Haopeng
Li, Jue
Fang, Fengzhou
Source :
Applied Sciences (2076-3417); 6/15/2019, Vol. 9 Issue 12, p2517, 11p
Publication Year :
2019

Abstract

The micro-displacement measurement system with 2D/3D has become increasingly important in the field of scientific research and technology application. In order to explore the application of an optical surface in micro-displacement measurement, a novel and simple 2D micro-displacement measurement method based on the elliptical paraboloid was designed and subjected to experiment. The measurement system takes advantage of the elliptical paraboloid instead of a plane mirror in the optical structure of an autocollimator which has been ameliorated to adapt to curved surface measurement. Through the displacement of the light spot on the CCD (Charge Coupled Device) detector, the displacement of the target could be measured with a linear correlation coefficient of 0.9999. The accuracy of the system is about ± 0.3 μm in a wide range in two dimensions. The results were in good agreement with the theoretical analysis and indicated the potential applicability of the proposed system in the detection of geometric errors of CNC (Computerized Numerical Control) machine tools. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20763417
Volume :
9
Issue :
12
Database :
Complementary Index
Journal :
Applied Sciences (2076-3417)
Publication Type :
Academic Journal
Accession number :
137307583
Full Text :
https://doi.org/10.3390/app9122517