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Erratum: "Vacancy defects and optoelectrical properties for fluorine tin oxide thin films with various SnF2 contents" [J. Appl. Phys. 123, 025706 (2018)].

Authors :
Zhou, Yawei
Xu, Wenwu
Li, Jingjing
Yin, Chongshan
Liu, Yong
Zhao, Bin
Chen, Zhiquan
He, Chunqing
Mao, Wenfeng
Ito, Kenji
Source :
Journal of Applied Physics; 6/21/2019, Vol. 125 Issue 23, pN.PAG-N.PAG, 1p
Publication Year :
2019

Abstract

A correction is presented to the article "Vacancy defects and optoelectrical properties for fluorine tin oxide thin films with various SnF2 contents" which appeared in the previous issue of the periodical.

Details

Language :
English
ISSN :
00218979
Volume :
125
Issue :
23
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
137129572
Full Text :
https://doi.org/10.1063/1.5110975