Evolution of SPR in 120 MeV silver ion irradiated Cu (18%) C60 nanocomposites thin films.

Copper metal embedded fullerene C₆₀ thin films are deposited on various substrates via resistive heating co evaporation technique. Rutherford back scattering simulated spectrum confirms the thickness and composition of thin film to be ~ 32 nm and ~ 18 at%, respectively. The deposited thin films are irradiated by 120 MeV Ag ion beam for different fluences within the range, from 1 × 10¹² to 3 × 10¹³ ions/cm². UV–vis absorption spectroscopy study reveals the appearance of surface plasmon resonance (SPR) band in pristine thin film at ~ 622 nm; this phenomenon is ascribed to the presence of copper nanoparticles in C₆₀ matrix. The SPR band intensity increases with rising fluences, which is suggestive of the growth of Cu nanoparticles. Growth of Cu nanoparticles is further confirmed by transmission electron microscopic (TEM) and X-ray diffraction (XRD) study. Whereas the conversion of C₆₀ into amorphous carbon (a-C) is confirmed by Raman spectroscopy, XRD results of pristine Cu–C₆₀ thin film record the presence of Cu₂O within the nanocomposite thin film. However, both X-ray photoelectron spectroscopy (XPS) and XRD studies on irradiated thin film samples authenticate the growth of Cu metal nanoparticles with concurrent removal of oxygen. [ABSTRACT FROM AUTHOR]