Back to Search Start Over

Research Into the LSTM Neural Network-Based Crystal Growth Process Model Identification.

Authors :
Zhang, Jing
Tang, Qinwei
Liu, Ding
Source :
IEEE Transactions on Semiconductor Manufacturing; May2019, Vol. 32 Issue 2, p220-225, 6p
Publication Year :
2019

Abstract

In this paper, a model identification method based on a long short-term memory (LSTM) neural network composed of a network structure and training algorithm is used to build a thermal field model that accurately simulates the crystal growth process. The support vector machine (SVM) approach is then adopted to identify model order and lag to determine network input and to improve precision. The thermal field model reflecting the growth process in the Czochralski crystal furnace is simulated. Experimental results and comparative analysis results both suggest that the method proposed by this paper can build an efficient thermal field model which outperforms other methods in terms of precision. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08946507
Volume :
32
Issue :
2
Database :
Complementary Index
Journal :
IEEE Transactions on Semiconductor Manufacturing
Publication Type :
Academic Journal
Accession number :
136254223
Full Text :
https://doi.org/10.1109/TSM.2019.2906651