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Timing Speculation With Optimal In Situ Monitoring Placement and Within-Cycle Error Prevention.

Authors :
Ahmadi Balef, Hadi
Fatemi, Hamed
Goossens, Kees
Pineda De Gyvez, Jose
Source :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems; May2019, Vol. 27 Issue 5, p1206-1217, 12p
Publication Year :
2019

Abstract

In this paper, a timing speculation technique with low-overhead in situ delay monitors placed along critical paths is presented. The proposed insertion of monitors enables timing error prevention within the same clock cycle. Compared to other techniques, the design cost per monitor in our technique is low because no additional gates for the guard banding, inspection window generation, and short path extension are required. We benchmarked our approach on an ARM Cortex M0. The insertion strategy reduces the number of monitors by up to $\sim 23\times $ , power by $\sim 5.5\times $ , and area by $\sim 2.8\times $ compared to the traditional in situ monitoring techniques that insert monitors at the flip-flops. The timing error correction uses a global clock stretching unit to prevent errors within one cycle. With the proposed error prevention technique, ~22% more delay variation is tolerated with a negligible energy overhead of less than ~1%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10638210
Volume :
27
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publication Type :
Academic Journal
Accession number :
136117407
Full Text :
https://doi.org/10.1109/TVLSI.2019.2895972