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Physical Origin of the Gate Current Surge During Short-Circuit Operation of SiC MOSFET.
- Source :
- IEEE Electron Device Letters; May2019, Vol. 40 Issue 5, p666-669, 4p
- Publication Year :
- 2019
-
Abstract
- During the short circuit of a vertical 4H-SiC power MOSFET, a high gate current starts to flow through the gate dielectric. We demonstrate that the Schottky emission is the main physical mechanisms. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 07413106
- Volume :
- 40
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- IEEE Electron Device Letters
- Publication Type :
- Academic Journal
- Accession number :
- 136117341
- Full Text :
- https://doi.org/10.1109/LED.2019.2896939