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Physical Origin of the Gate Current Surge During Short-Circuit Operation of SiC MOSFET.

Authors :
Boige, F.
Tremouilles, D.
Richardeau, F.
Source :
IEEE Electron Device Letters; May2019, Vol. 40 Issue 5, p666-669, 4p
Publication Year :
2019

Abstract

During the short circuit of a vertical 4H-SiC power MOSFET, a high gate current starts to flow through the gate dielectric. We demonstrate that the Schottky emission is the main physical mechanisms. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
40
Issue :
5
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
136117341
Full Text :
https://doi.org/10.1109/LED.2019.2896939