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Special Issue for I2MTC 2018.

Authors :
Rapuano, Sergio
Hwang, Chi Hung
Xiao, George
Source :
IEEE Transactions on Instrumentation & Measurement; May2019, Vol. 68 Issue 5, p1235-1237, 3p
Publication Year :
2019

Abstract

The 35th IEEE International Instrumentation and Measurement Technical Conference (I2MTC) was held in Houston, TX, USA, on May 22–25, 2018. I2MTC is the flagship conference of the IEEE Instrumentation and Measurement Society held every year since 1986. It is dedicated to advances in measurement methodologies, measurement systems, instrumentation, and sensors in all areas of science and technology. The I2MTC is proposed as a catalyst to promote interactions between industry and academia; a wide spectrum of academic research results is presented, with potential practical applications in current industrial technology, as well as industry and application-driven developments. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
68
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
135966666
Full Text :
https://doi.org/10.1109/TIM.2019.2907182